Запис Детальніше

STATISTICAL TECHNIQUES IN INTEGRATED CERTIFICATION TEST CIRCUITS

Науковий журнал «Радіоелектроніка, інформатика, управління»

Переглянути архів Інформація
 
 
Поле Співвідношення
 
##plugins.schemas.marc.fields.042.name## dc
 
##plugins.schemas.marc.fields.245.name## STATISTICAL TECHNIQUES IN INTEGRATED CERTIFICATION TEST CIRCUITS
 
##plugins.schemas.marc.fields.720.name## Tomashevskiy, O. V.; Zaporizhzhia National Technical University
Pogosov, V. V.; Zaporizhzhia National Technical University
Snizhnyi, G. V.; Zaporizhzhia National Technical University
 
##plugins.schemas.marc.fields.520.name## <p>The analysis of tests of integred microcircuits and existent plans of control is ove performed. Plans and indexes of quality for plugging in the program of certifications tests are certain. The correct procedure of statistical treatment of results are offered.</p>
 
##plugins.schemas.marc.fields.260.name## Zaporizhzhya National Technical University
2014-04-14 00:00:00
 
##plugins.schemas.marc.fields.856.name## application/pdf
http://ric.zntu.edu.ua/article/view/23530
 
##plugins.schemas.marc.fields.786.name## Radio Electronics, Computer Science, Control; No 1 (2009): Radio Electronics, Computer Science, Control
 
##plugins.schemas.marc.fields.540.name## Copyright (c) 2014 O. V. Tomashevskiy, V. V. Pogosov, G. V. Snizhnyi