Запис Детальніше

Structural and substructural properties of the zinc and cadmium chalcogenides thin films (a review)

Electronic Archive of Sumy State University

Переглянути архів Інформація
 
 
Поле Співвідношення
 
Title Structural and substructural properties of the zinc and cadmium chalcogenides thin films (a review)
 
Creator Panchal, С. J.
Panchal, С. J.
Panchal, С. J.
Опанасюк, Анатолій Сергійович
Опанасюк, Анатолий Сергеевич
Opanasiuk, Anatolii Serhiiovych
Косяк, Володимир Володимирович
Косяк, Владимир Владимирович
Kosiak, Volodymyr Volodymyrovych
Desai, M. S.
Desai, M. S.
Desai, M. S.
Проценко, Іван Юхимович
Проценко, Иван Ефимович
Protsenko, Ivan Yukhymovych
 
Subject physical properties
defects
zinc and cadmium chalcogenides films
crystal structure
 
Description In this paper, the structural properties of the zinc and cadmium chalcogenide thin films are considered. The influence of the structural defects such as grain boundaries, dislocations, native point defects, etc., on the optical and electrical properties of the thin films was studied. The methods of the II-VI thin films deposition are described. The influence on the sub-structural properties (phase compositions, texture, grain size, tacking faults concentration, micro deformation levels, and coherent domain size) of the thin films grown by the close-spaced vacuum evaporation method was analyzed. The growth conditions of the thin films with optimized parameters have been determined.
When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/30129
 
Publisher Видавництво СумДУ
 
Date 2013-02-12T10:59:05Z
2013-02-12T10:59:05Z
2011
 
Type Article
 
Identifier Panchal C. J. Structural and substructural properties of the zinc and cadmium chalcogenides thin films (a review) [Текст] / C.J. Panchal, A.S. Opanasyuk, V.V. Kosyak, M.S. Desai, I.Yu. Protsenko // J. Nano- Electron. Phys. – 2011. – V. 3 (1). – P. 274-301.
http://essuir.sumdu.edu.ua/handle/123456789/30129
 
Language en