Raman analysis of Zn1-xMnxTe polycrystalline films
Electronic Archive of Sumy State University
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Title |
Raman analysis of Zn1-xMnxTe polycrystalline films
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Creator |
Климов, Олексій Володимирович
Климов, Алексей Владимирович Klymov, Oleksii Volodymyrovych Курбатов, Денис Ігорович Курбатов, Денис Игоревич Kurbatov, Denys Ihorovych Опанасюк, Анатолій Сергійович Опанасюк, Анатолий Сергеевич Opanasiuk, Anatolii Serhiiovych Косяк, Володимир Володимирович Косяк, Владимир Владимирович Kosiak, Volodymyr Volodymyrovych Копач, В. Копач, В. Kopach, V. Болотников, А.Е. Болотников, А.Е. Bolotnikov, А.Е. Джеймс, Р.Б. Джеймс, Р.Б. James, R.B. Фочук, П.М. Фочук, П.М. Fochuk, P.M. |
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Subject |
Raman spectroscopy
surface morphology x-ray diffraction lattice parameters solid solution of Zn1-xMnxTe closed space vacuum sublimation |
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Description |
In this paper, we have investigated some structural properties, Raman spectra of Zn1-xMnxTe films deposited by the closed space vacuum sublimation under different growth conditions. The obtained results of the Raman spectroscopy and XRD analysis show single phase composition of the samples. The presence of phonon replicas in the Raman spectra of the films indicates their high structural quality. The manganese content (about 7 %) in the layers was determined according to shifting the relative peaks positions. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/33848 This work performed under the state budget project №0113U000131 Ministry of Education and Science of Ukraine and with the support of the State Agency for Science, Innovation and Informatization of Ukraine. |
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Publisher |
SPIE
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Date |
2014-02-03T10:17:31Z
2014-02-03T10:17:31Z 2013 |
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Type |
Article
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Identifier |
Raman analysis of Zn1-xMnxTe polycrystalline films [Text] / О. V. Klimov , D. I. Kurbatov , A. S. Opanasyuk , V. V. Kosyak , V. Kopach , P. M. Fochuk , A. E. Bolotnikov, R. B. James // Proc. of SPIE. – 2013. – P. 88521G-1-88521G-5.
http://essuir.sumdu.edu.ua/handle/123456789/33848 |
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Language |
en
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Relation |
Vol. 8852;
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