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Raman analysis of Zn1-xMnxTe polycrystalline films

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Title Raman analysis of Zn1-xMnxTe polycrystalline films
 
Creator Климов, Олексій Володимирович
Климов, Алексей Владимирович
Klymov, Oleksii Volodymyrovych
Курбатов, Денис Ігорович
Курбатов, Денис Игоревич
Kurbatov, Denys Ihorovych
Опанасюк, Анатолій Сергійович
Опанасюк, Анатолий Сергеевич
Opanasiuk, Anatolii Serhiiovych
Косяк, Володимир Володимирович
Косяк, Владимир Владимирович
Kosiak, Volodymyr Volodymyrovych
Копач, В.
Копач, В.
Kopach, V.
Болотников, А.Е.
Болотников, А.Е.
Bolotnikov, А.Е.
Джеймс, Р.Б.
Джеймс, Р.Б.
James, R.B.
Фочук, П.М.
Фочук, П.М.
Fochuk, P.M.
 
Subject Raman spectroscopy
surface morphology
x-ray diffraction
lattice parameters
solid solution of Zn1-xMnxTe
closed space vacuum sublimation
 
Description In this paper, we have investigated some structural properties, Raman spectra of Zn1-xMnxTe films deposited by the
closed space vacuum sublimation under different growth conditions. The obtained results of the Raman spectroscopy and
XRD analysis show single phase composition of the samples. The presence of phonon replicas in the Raman spectra of
the films indicates their high structural quality. The manganese content (about 7 %) in the layers was determined
according to shifting the relative peaks positions.
When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/33848
This work performed under the state budget project №0113U000131 Ministry of Education and Science of
Ukraine and with the support of the State Agency for Science, Innovation and Informatization of Ukraine.
 
Publisher SPIE
 
Date 2014-02-03T10:17:31Z
2014-02-03T10:17:31Z
2013
 
Type Article
 
Identifier Raman analysis of Zn1-xMnxTe polycrystalline films [Text] / О. V. Klimov , D. I. Kurbatov , A. S. Opanasyuk , V. V. Kosyak , V. Kopach , P. M. Fochuk , A. E. Bolotnikov, R. B. James // Proc. of SPIE. – 2013. – P. 88521G-1-88521G-5.
http://essuir.sumdu.edu.ua/handle/123456789/33848
 
Language en
 
Relation Vol. 8852;