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Synthesis and Characterization of ZnSe1-xTex Alloy Thin Films Deposited by Electron Beam Technique

Electronic Archive of Sumy State University

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Title Synthesis and Characterization of ZnSe1-xTex Alloy Thin Films Deposited by Electron Beam Technique
 
Creator Suthagar, J.
Suthan Kissinger, J.K.
 
Subject ZnSe1-x Tex
ZnSe
ZnTe
Solid Solution
DTA/TGA
 
Description ZnSe1-x Tex solid solutions were prepared and films were deposited on glass substrates with x 0.2, 0.4,
0.6 and 0.8. DTA/TGA analysis was carried out to study the alloy formation temperature. Structural studies
by XRD results showed the polycrystalline nature of the films. The Full Width at Half Maximum
(FWHM) values were observed from the XRD pattern and used to evaluate the microstructural parameters
like crystallite size, strain, dislocation density and stacking fault density for all the films with x 0.2, 0.4,
0.6 and 0.8. These films were coated with a thickness of about 200 nm on glass substrates keeping the
temperature constant at 200 C. All films showed cubic structure and the lattice parameter values are
found to vary with „X‟. This confirms the solid solution formation between the ZnSe and ZnTe binary compounds
which are found to obey Vegard‟s law. SEM and AFM studies have been arried out to observe their
surface modification with solid solution formation. Raman studies confirm the formation of ZnSe1-xTex compound
films.
 
Publisher Sumy State University
 
Date 2014-05-26T11:32:53Z
2014-05-26T11:32:53Z
2012
 
Type Article
 
Identifier Suthagar, Kissinger J.K. Synthesis and Characterization of ZnSe1-xTex Alloy Thin Films Deposited by Electron Beam Technique / J. Suthagar, K. J. Suthan // Nanomaterials: Applications & Properties (NAP-2012) : 2-nd International conference, Alushta, the Crimea, September 17-22, 2012 / Edited by: A. Pogrebnjak. - Sumy : Sumy State University, 2012. - V. 1, No3. - 03TF08
http://essuir.sumdu.edu.ua/handle/123456789/35012
 
Language en