Запис Детальніше

Raman Investigation on ZnS, ZnSe, ZnTe Thin Films Obtained by CSVS Technique

Electronic Archive of Sumy State University

Переглянути архів Інформація
 
 
Поле Співвідношення
 
Title Raman Investigation on ZnS, ZnSe, ZnTe Thin Films Obtained by CSVS Technique
 
Creator Опанасюк, Анатолій Сергійович
Опанасюк, Анатолий Сергеевич
Opanasiuk, Anatolii Serhiiovych
Іващенко, Максим Миколайович
Иващенко, Максим Николаевич
Ivashchenko, Maksym Mykolaiovych
Климов, Олексій Володимирович
Климов, Алексей Владимирович
Klymov, Oleksii Volodymyrovych
Курбатов, Денис Ігорович
Курбатов, Денис Игоревич
Kurbatov, Denys Ihorovych
Колесник, Максим Миколайович
Колесник, Максим Николаевич
Kolesnyk, Maksym Mykolaiovych
Cheong, H.
Nam, D.
 
Subject Zinc sulfide
Zinc selenide
Zinc telluride
Films
Replica
Phonon
Raman spectroscopy
 
Description In this work, Raman spectra of zinc sulfide, zinc selenide, and zinc telluride thin film semiconductors
deposited by the close-spaced vacuum sublimation technique were investigated. All of the films showed
longitudinal optical phonon mode replicas. Varying the substrate temperature results in small shifts of the
phonon frequencies in ZnSe and ZnTe, but not in ZnS thin films.
 
Publisher Sumy State University
 
Date 2014-05-27T07:20:49Z
2014-05-27T07:20:49Z
2012
 
Type Article
 
Identifier Raman Investigation on ZnS, ZnSe, ZnTe Thin Films Obtained by CSVS Technique / H. Cheong, D. Nam, A. S. Opanasyuk et al. // Nanomaterials: Applications & Properties (NAP-2012) : 2-nd International conference, Alushta, the Crimea, September 17-22, 2012 / Edited by: A. Pogrebnjak. - Sumy : Sumy State University, 2012. - V.1, No3. - 03TF21
http://essuir.sumdu.edu.ua/handle/123456789/35100
 
Language en