Substructural Features of Zn1-xMnxTe Solid Solution Thin Films
Electronic Archive of Sumy State University
Переглянути архів Інформація| Поле | Співвідношення | |
| Title |
Substructural Features of Zn1-xMnxTe Solid Solution Thin Films
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| Creator |
Курбатов, Денис Ігорович
Курбатов, Денис Игоревич Kurbatov, Denys Ihorovych Климов, Олексій Володимирович Климов, Алексей Владимирович Klymov, Oleksii Volodymyrovych Опанасюк, Анатолій Сергійович Опанасюк, Анатолий Сергеевич Opanasiuk, Anatolii Serhiiovych Danilchenko, S.M. Khlyap, H.M. |
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| Subject |
Substructure
X-ray diffraction patterns Microdeformations Orientation factor |
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| Description |
The substructural characteristics of Zn1-xMnxTe films deposited by closed space vacuum sublimation method under various condensation conditions are investigated. Sizes of the coherent scattering domain size, microdeformation degree, staking fault defects’ concentration in the condensates, the averaged dislocation density at the subgrain boundaries and in their bulk as well as the total dislocation concentration are determined by the physical broadening of the X-ray lines using the Cauchy and gauss approximations and the threefold function convolution method. The calculations are compared with data for undoped ZnTe. It is found out that the Mn-doping causes some degradation of structural characteristics of the condensates compared with undoped layers. |
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| Publisher |
Sumy State University
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| Date |
2014-05-27T06:07:23Z
2014-05-27T06:07:23Z 2012 |
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| Type |
Article
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| Identifier |
Substructural Features of Zn1-xMnxTe Solid Solution Thin Films / O. V. Klymov, D. I. Kurbatov, A. S. Opanasyuk et al.
// Nanomaterials: Applications & Properties (NAP-2012) : 2-nd International conference, Alushta, the Crimea, September 17-22, 2012 / Edited by: A. Pogrebnjak. - Sumy : Sumy State University, 2012. - V. 1, No3. - 03TF23
http://essuir.sumdu.edu.ua/handle/123456789/35057 |
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| Language |
en
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