Small Angle X-ray Scattering in Thin Iron Films
Electronic Archive of Sumy State University
Переглянути архів Інформація| Поле | Співвідношення | |
| Title |
Small Angle X-ray Scattering in Thin Iron Films
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| Creator |
Chekadanov, A.S.
Kuzmenko, A.P. Emelyanov, S.G. Chevyakov, L.M. Dobromyslov, M.B. |
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| Subject |
Small angle X-ray scattering
Atomic force Scanning electron Digital holographic microscopy Thin magnetron films |
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| Description |
By small angle X-ray scattering (SAXS) and atomic force microscopy characteristic sizes are deter-mined, structural features of thin iron films deposited by magnetron evaporation onto substrates from py-roceramics are established. It is shown that morphologically the film is characterized by disorder. It is formed from columnar nano crystallites that are oriented either perpendicular to the substrate or situated in its plane, which dictates polydispersity of those coatings. It is shown that SAXS may be thought of as nondestructive technique for analyzing structure and composition and conducting quality control of mag-netron films. |
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| Publisher |
Sumy State University
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| Date |
2014-07-30T11:10:06Z
2014-07-30T11:10:06Z 2014 |
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| Type |
Article
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| Identifier |
A.S. Chekadanov, A.P. Kuzmenko, S.G. Emelyanov, et al., J. Nano- Electron. Phys. 6 No 3, 03023 (2014)
http://essuir.sumdu.edu.ua/handle/123456789/36258 |
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| Language |
en
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