Composition variations in Cu2ZnSnSe4 thin films analyzed by X-ray diffraction, energy dispersive X-ray spectroscopy, particle induced X-ray emission, photoluminescence, and Raman spectroscopy
Electronic Archive of Sumy State University
Переглянути архів Інформація| Поле | Співвідношення | |
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Composition variations in Cu2ZnSnSe4 thin films analyzed by X-ray diffraction, energy dispersive X-ray spectroscopy, particle induced X-ray emission, photoluminescence, and Raman spectroscopy
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Нам, Д.
Nam, Dahyun Опанасюк, Анатолій Сергійович Опанасюк, Анатолий Сергеевич Opanasiuk, Anatolii Serhiiovych Коваль, Павло Вікторович Коваль, Павел Викторович Koval, Pavlo Victorovich Пономарьов, О. Г. Пономарев, А. Г. Ponomarev, O. G. Джонг, А.Р. Jeong, Ah Reum Кім, Д.Й. Ким, Д.Й. Kim, Gee Yeong Джо, В. Jo, William Чеонг, Г. Cheong, Hyeonsik |
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Copper–zinc–tin selenide
Thin films X-ray diffraction Energy dispersive X-ray spectroscopy Raman spectroscopy Confocal microscopy Particle induced X-ray emission Photoluminescence |
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| Description |
Compositional and structural studies of Cu2ZnSnSe4 (CZTSe) thin films were carried out by X-ray diffraction, energy dispersive X-ray spectroscopy (EDS), particle induced X-ray emission (PIXE), photoluminescence, and Raman spectroscopy. CZTSe thin films with different compositions were deposited on sodalime glass by coevaporation. The composition of the filmsmeasured by two differentmethods, EDS and PIXE, showed significant differences. Generally, the Zn/Sn ratio measured by EDS is larger than that measured by PIXE. Both the micro- PIXE and the micro-Raman imaging results indicated the compositional and structural inhomogeneity of the sample. This researchwas supported by the International Research&Development Program of the National Research Foundation of Korea funded by theMinistry of Science, ICT and Future Planning of Korea (Grant number: 2011-0019204) and by the New & Renewable Energy of the Korea Institute of Energy Technology Evaluation and Planning grant funded by the Korea government’s Ministry of Trade, Industry and Energy (No. 20123010010130). |
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ELSEVIER
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| Date |
2014-10-14T10:55:54Z
2014-10-14T10:55:54Z 2014 |
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Article
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| Identifier |
Dahyun Nama et al. Composition variations in Cu2ZnSnSe4 thin films analyzed by X-ray diffraction, energy dispersive X-ray spectroscopy, particle induced X-ray emission, photoluminescence, and Raman spectroscopy / Dahyun Nama, A.S. Opanasyukb, P.V. Kovalb, A.G. Ponomarevb, Ah Reum Jeongc, Gee Yeong Kimc, William Joc, Hyeonsik Cheong //Thin Solid Films, Volume 562, 1 July 2014, P. 109–113.
http://essuir.sumdu.edu.ua/handle/123456789/37033 |
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en
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