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Studying the Elemental Composition and Manganese Distribution in Zn1 – xMnxTe and Zn1 – xMnxS Films Using the μ PIXE and EDAX Methods

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Title Studying the Elemental Composition and Manganese Distribution in Zn1 – xMnxTe and Zn1 – xMnxS Films Using the μ PIXE and EDAX Methods
 
Creator Курбатов, Денис Ігорович
Курбатов, Денис Игоревич
Kurbatov, Denys Ihorovych
Климов, Олексій Володимирович
Климов, Алексей Владимирович
Klymov, Oleksii Volodymyrovych
Опанасюк, Анатолій Сергійович
Опанасюк, Анатолий Сергеевич
Opanasiuk, Anatolii Serhiiovych
Пономарьов, О. Г.
Пономарев, А. Г.
Ponomarev, O. G.
Мельник, С. С.
Мельник, С. С.
Mel’nik, S. S.
 
Subject manganese
μ PIXE technique
thermal vapor deposition
 
Description The methods of proton induced X ray emission (μ PIXE) and energy dispersive X ray analysis
(EDAX) are used to study the elemental composition and areal distribution of manganese in Zn1 – xMnxTe
and Zn1 – xMnxS films. The μ PIXE technique is implemented using a nuclear scanning microprobe with a
proton beam energy of 1.5 MeV and cross sectional dimensions of 4 × 4 μm. The semimagnetic solid solu
tion films are obtained under different operating modes of thermal vapor deposition in the quasiclosed vol
ume of a manganese containing blend.
This study was conducted as part of a research
project by request of the Ministry of Education and
Science of Ukraine and the State Agency for Science,
Innovation, and Informatization of Ukraine.
 
Publisher Pleiades Publishing, Ltd.
 
Date 2014-10-16T11:41:27Z
2014-10-16T11:41:27Z
2014
 
Type Article
 
Identifier Studying the Elemental Composition and Manganese Distribution in Zn1 – xMnxTe and Zn1 – xMnxS Films Using the μ PIXE and EDAX Methods / Kurbatov D.I., Klymov A.V., Ponomarev O.G., Mel’nik S.S., Opanasyuk A.S. // Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques. - 2014, V.8, № 2, p. 259-262
1027 4510
http://essuir.sumdu.edu.ua/handle/123456789/37062
 
Language en