Mechanism of contact resistance formation in ohmic contacts with high dislocation density
Zhytomyr State University Library
Переглянути архів Інформація| Поле | Співвідношення | |
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http://eprints.zu.edu.ua/10520/
ttp://jap.aip.org/ |
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| Title |
Mechanism of contact resistance formation in ohmic contacts with high dislocation density
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| Creator |
Sachenкo, А. V.
Belyaev, А. Е. Boltovets, N. S. Konaкova, R. V. Kudryк, Y. Y. Novytsкyі, S. V. Sheremet, V. N. Lі, J. Vіtusevіch, S. А. |
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| Subject |
QC Physics
TK Electrical engineering. Electronics Nuclear engineering |
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| Description |
A new mechanism of contact resistance formation in ohmic contacts with high dislocation density is proposed. Its specific feature is the appearance of a characteristic region where the contact resistance increases with temperature. According to the mechanism revealed, the current flowing through the metal shunts associated with dislocations is determined by electron diffusion. It is shown that current flows through the semiconductor near-surface regions where electrons accumulate. A feature of the mechanism is the realization of ohmic contact irrespective of the relation between the contact and bulk resistances. The theory is proved for contacts formed to III-V semiconductor materials as well as silicon-based materials. A reasonable agreement between theory and experimental results is obtained |
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| Publisher |
Американский институт физики
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| Date |
2012
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| Type |
Article
PeerReviewed |
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| Format |
text
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| Language |
uk
english |
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| Identifier |
http://eprints.zu.edu.ua/10520/1/Sachenko%20A.V.%20%28Mechanism%20of%20contact%20resistance%20formation%20in%20ohmic%20contacts%20with%20high%20dislocation%20density%29%202012.pdf
Sachenкo, А. V. and Belyaev, А. Е. and Boltovets, N. S. and Konaкova, R. V. and Kudryк, Y. Y. and Novytsкyі, S. V. and Sheremet, V. N. and Lі, J. and Vіtusevіch, S. А. (2012) Mechanism of contact resistance formation in ohmic contacts with high dislocation density. Journal of Applied Physics, 111 (8). 083701-083701. ISSN 0021-8979 |
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