Effect of thermal annealing on the electrical parameters of ohmic contacts to n-n+-n++-InP
Zhytomyr State University Library
Переглянути архів Інформація| Поле | Співвідношення | |
| Relation |
http://eprints.zu.edu.ua/11040/
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| Title |
Effect of thermal annealing on the electrical parameters of ohmic contacts to n-n+-n++-InP
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| Creator |
Novytsкyі, S. V.
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| Subject |
QC Physics
TK Electrical engineering. Electronics Nuclear engineering |
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| Publisher |
Ivano-Frankivsk
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| Date |
2011-05
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| Type |
Article
PeerReviewed |
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| Format |
text
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| Language |
uk
english |
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| Identifier |
http://eprints.zu.edu.ua/11040/1/%D0%86%D0%B2%D0%B0%D0%BD%D0%BE-%D0%A4%D1%80%D0%B0%D0%BD%D0%BA%D1%96%D0%B2%D1%81%D1%8C%D0%BA%202011.pdf
Novytsкyі, S. V. (2011) Effect of thermal annealing on the electrical parameters of ohmic contacts to n-n+-n++-InP. Materials of a conf. [XIII International conf. «Physics and technology of thin films and nanosystems» (ICPTTFN-XIII)]Ivano-Frankivsk, Ukraine, 16—21 May 2011 y.), 1. p. 112. |
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