Thin overlayer influence on electrophysical properties of nickel films
Electronic Archive of Sumy State University
Переглянути архів Інформація| Поле | Співвідношення | |
| Title |
Thin overlayer influence on electrophysical properties of nickel films
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| Creator |
Чорноус, Анатолій Миколайович
Чорноус, Анатолий Николаевич Chornous, Anatolii Mykolaiovych Говорун, Тетяна Павлівна Говорун, Татьяна Павловна Hovorun, Tetiana Pavlivna |
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| Subject |
thin films
resistivity reflection coefficient тонкі плівки питомий опір коефіцієнт відбиття тонкие пленки удельное сопротивление коэффициент отражения |
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| Description |
In this work it is experimentally investigated a size effect in temperature coefficient of resistance (TCR) of Ni films with Cu and Si02 thin overiayer. The parameters of electrical transfer (the mean-free path of electron, the reflectivity coefficient of the external surfaces, the reflection and transmission coefficients at the grain boundary) were calculations. Decreasing of the value of the reflectivity coefficient is due to the change of the surface microrelief. It is show that the value of TCR decreases caused by the conditions of scattering changes on internal and external boundaries.
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| Publisher |
WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
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| Date |
2010-12-17T11:25:17Z
2010-12-17T11:25:17Z 2006 |
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| Type |
Article
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| Identifier |
Hovorun T. Thin overlayer influence on electrophysical properties of nickel films [Text] / T. Hovorun, A. Chornous // Cryst. Res. Technol. 41, No 5, 458 - 463 (2006).
http://essuir.sumdu.edu.ua/handle/123456789/583 |
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| Language |
en
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