Features of Decision Support’s Program at Choice of Tests Optimized Sequence for Semiconductors Memory Diagnosing
Електронного архіву Харківського національного університету радіоелектроніки (Open Access Repository of KHNURE)
Переглянути архів Інформація| Поле | Співвідношення | |
| Creator |
Ryabtsev, V.G
Almadi, M.K. |
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| Date |
2014-10-30T11:27:36Z
2014-10-30T11:27:36Z 2008 |
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| Identifier |
Ryabtsev, V.G Features of Decision Support’s Program at Choice of Tests Optimized Sequence for Semiconductors Memory Diagnosing / V.G Ryabtsev, M.K. Almadi // Радиоэлектроника и информатика : науч.-техн. журн. – Х. : Изд-во ХНУРЭ, 2008. – Вып. 1. – С. 84-95.
http://hdl.handle.net/123456789/1415 |
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| Description |
A method, which allows decreasing calculations works labour intensiveness at the choice of paret-optimum tests for semiconductors storage devices diagnosing is offered. This method is realized in the program Optimal-test, which allows decreasing the duration of memory’s microcircuits testing without worsening of their quality.
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| Language |
en
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| Publisher |
ХНУРЭ
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| Subject |
diagnosing
microcircuit memory test. |
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| Title |
Features of Decision Support’s Program at Choice of Tests Optimized Sequence for Semiconductors Memory Diagnosing
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| Type |
Article
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