Запис Детальніше

The Essentials of Testing Digital Circuit

Електронного архіву Харківського національного університету радіоелектроніки (Open Access Repository of KHNURE)

Переглянути архів Інформація
Поле Співвідношення
Creator Ngene, Ch. U.
Date 2014-12-09T12:01:52Z
Identifier Ngene, C. U. The Essentials of Testing Digital Circuits / C. U. Ngene // Радиоэлектроника и информатика : науч.-техн. журн. – Х. : Изд-во ХНУРЭ, 2012. – Вып. 1. – С. 22-30.
Description Testing is an important part of digital devices development life cycle and it takes about 70% of time to market. This paper discusses the various testing concepts as it
relates to digital design and how it impacts the reliability of the final product. We also show that making designs testable by
using appropriate design for testability techniques considerably reduces testing time and ensures a fine-grained diagnosis of finished product. A three bit counter circuit was used to illustrate the benefits of design for testability by using scan chain methodology.
Language en
Publisher ХНУРЭ
Subject reliability
design for testability
defect level
Title The Essentials of Testing Digital Circuit
Type Article