Soft X-ray imaging of thick carbon-based materials using the normal incidence multilayer optics
Цифровой репозитарии Национального технического университета "Харьковский политехнический институт" (eNTUKhPIIR)
Переглянути архів Інформація| Поле | Співвідношення | |
| Title |
Soft X-ray imaging of thick carbon-based materials using the normal incidence multilayer optics
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| Creator |
Artyukov, I. A.
Feschenko, R. M. Vinogradov, A. V. Bugayev, Ye. A. Devizenko, O. Y. Kondratenko, V. V. Kasyanov, Yu. S. Hatano, T. Yamamoto, M. Saveliev, S. V. |
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| Subject |
soft X-ray microscopy
carbon window X-ray multilayer mirror laser plasma |
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| Description |
The high transparency of carbon-containing materials in the spectral region of “carbon window” (∼4.5–5 nm) introduces new opportunities for various soft X-ray microscopy applications. The development of efficient multilayer coated X-ray optics operating at the wavelengths of about 4.5nm has stimulated a series of our imaging experiments to study thick biological and synthetic objects. Our experimental set-up consisted of a laser plasma X-ray source generated with the 2nd harmonics of Nd–glass laser, scandium-based thin-film filters, Co/C multilayer mirror and X-ray film UF-4. All soft X-ray images were produced with a single nanosecond exposure and demonstrated appropriate absorption contrast and detector-limited spatial resolution. A special attention was paid to the 3D imaging of thick low-density foam materials to be used in design of laser fusion targets
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| Date |
2014-03-12T18:35:21Z
2014-03-12T18:35:21Z 2010 |
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| Type |
Article
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| Identifier |
Soft X-ray imaging of thick carbon-based materials using the normal incidence multilayer optics / I. A. Artyukov [et al.] // Micron. – 2010. – Vol. 41. – p. 722-728.
http://repository.kpi.kharkov.ua/handle/KhPI-Press/4713 |
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| Language |
en
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| Publisher |
Elsevier Ltd
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