Electron traps in solid Xe
Vernadsky National Library of Ukraine
Переглянути архів ІнформаціяПоле | Співвідношення | |
Title |
Electron traps in solid Xe
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Creator |
Khyzhniy, Ivan V.
Uyutnov, Sergey A. Savchenko, Elena V. Gumenchuk, Galina B. Ponomaryov, Alexey N. Bondybey, Vladimir E. |
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Subject |
7th International Conference on Cryocrystals and Quantum Crystals
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Description |
Correlated real-time measurements of thermally stimulated luminescence and exoelectron emission from solid Xe pre-irradiated with an electron beam were performed. The study enabled us to distinguish between surface and bulk traps in solid Xe and to identify a peak related to electronically induced defects. The activation energy corresponding to annihilation of these defects was estimated by the following methods: the method of different heating rates, the initial-rise method, and the curve cleaning technique with fitting of the thermally stimulated luminescence glow curve.
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Date |
2017-05-20T07:09:33Z
2017-05-20T07:09:33Z 2009 |
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Type |
Article
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Identifier |
Electron traps in solid Xe / Ivan V. Khyzhniy, Sergey A. Uyutnov, Elena V. Savchenko, Galina B. Gumenchuk, Alexey N. Ponomaryov, Vladimir E. Bondybey // Физика низких температур. — 2009. — Т. 35, № 4. — С. 433-437. — Бібліогр.: 13 назв. — англ.
0132-6414 PACS: 78.60.Kn, 79.75.+g http://dspace.nbuv.gov.ua/handle/123456789/117131 |
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Language |
en
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Relation |
Физика низких температур
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Publisher |
Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
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