Запис Детальніше

Silicon carbide phase transition in as-grown 3C-6H polytypes junction

Vernadsky National Library of Ukraine

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Title Silicon carbide phase transition in as-grown 3C-6H polytypes junction
 
Creator Vlaskina, S.I.
Mishinova, G.N.
Vlaskin, V.I.
Svechnikov, G.S.
Rodionov, V.E.
Lee, S.W.
 
Description Perfect pure (concentration of donors ~ 10¹⁶cm⁻³ ) single crystals with joint
polytypes (hexagonal-cubic) or heterojunction investigated using low temperature (4.2 K
and 77 K) photoluminescence. Phase transformation started exactly from lamella
between polytypes. β → α ( 3C 6H ) SiC transformation distributes from lamella as
from nuclear. Photoluminescence spectra are similar to the spectrum demonstrated by
pure perfect 3C-SiC crystal in the field of mechanical deformation. In the zone of joint
polytypes and zone of the plastic deformation in perfect 3C-SiC crystal after bending, the
same stacking faults are localized. Luminescence in the disordered α-zone as a result of
phase transformation is represented by a set of intensely pronounced stacking fault
spectra. These spectra reside on more or less intense background band, which are
emission of the donor-acceptor pairs in SiC. Excitation luminescence spectra confirm
appearance of stacking faults which are responsible for metastable intermediate microand
nano-SiC structures. Solid-phase transformations β → α are related with the same
intermediate metastable microstructure that take place in the transformation α → β.
 
Date 2017-05-26T09:12:16Z
2017-05-26T09:12:16Z
2013
 
Type Article
 
Identifier Silicon carbide phase transition in as-grown 3C-6H polytypes junction / S.I. Vlaskina, G.N. Mishinova, V.I. Vlaskin, G.S. Svechnikov, V.E. Rodionov, S.W. Lee // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2013. — Т. 16, № 2. — С. 132-135. — Бібліогр.: 12 назв. — англ.
1560-8034
PACS 64.70.K-, 77.84.Bw, 81.30.-t
http://dspace.nbuv.gov.ua/handle/123456789/117681
 
Language en
 
Relation Semiconductor Physics Quantum Electronics & Optoelectronics
 
Publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України