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Tunneling current via dislocations in InAs and InSb infrared photodiodes

Vernadsky National Library of Ukraine

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Title Tunneling current via dislocations in InAs and InSb infrared photodiodes
 
Creator Sukach, A.V.
Tetyorkin, V.V.
Krolevec, N.M.
 
Description Carrier transport mechanisms are investigated in InAs and InSb infrared
photodiodes. The photodiodes were prepared by thermal diffusion of Cd and ion
implantation of Be into InAs and InSb single-crystal substrates of n-type conductivity,
respectively. The direct current was measured as a function of bias voltage and
temperature. The excess tunneling current is observed in the investigated photodiodes at
small forward bias voltages. Experimental proofs are obtained that dislocations are
responsible for this current. A model for the tunneling current via dislocations is briefly
discussed.
 
Date 2017-05-26T17:40:17Z
2017-05-26T17:40:17Z
2011
 
Type Article
 
Identifier Tunneling current via dislocations in InAs and InSb infrared photodiodes / A.V. Sukach, V.V. Tetyorkin and N.M. Krolevec // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2011. — Т. 14, № 4. — С. 416-420. — Бібліогр.: 27 назв. — англ.
1560-8034
PACS 61.72.uj, Hh, Lk;73.40.Gk, Kp; 85.60.Dw
http://dspace.nbuv.gov.ua/handle/123456789/117788
 
Language en
 
Relation Semiconductor Physics Quantum Electronics & Optoelectronics
 
Publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України