Ultrasonic assisted nanomanipulations with atomic force microscope
Vernadsky National Library of Ukraine
Переглянути архів Інформація| Поле | Співвідношення | |
| Title |
Ultrasonic assisted nanomanipulations with atomic force microscope
|
|
| Creator |
Lytvyn, P.M.
Olikh, O.Ya. Lytvyn, O.S. Dyachyns’ka, O.M. Prokopenko, I.V. |
|
| Description |
Demonstrated experimentally in this work was the possibility of controlled handling the nanoparticles with the size from 50 up to 250 nm on a semiconductor surface by using an atomic force microscope under conditions of acoustic excitation. It has been shown that the selective transport of particles of a certain size is possible owing to the change of an ultrasonic vibration amplitude. Also in this study, possible mechanisms in which ultrasound may influence the particle-surface interaction and the probe-particle (surface) interaction have been analyzed. |
|
| Date |
2017-05-26T14:40:56Z
2017-05-26T14:40:56Z 2010 |
|
| Type |
Article
|
|
| Identifier |
Ultrasonic assisted nanomanipulations with atomic force microscope / P.M. Lytvyn, O.Ya. Olikh, O.S. Lytvyn, O.M. Dyachyns’ka, I.V. Prokopenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 1. — С. 36-42. — Бібліогр.: 38 назв. — англ.
1560-8034 PACS 07.79.Sp, 43.35.-c, 68.37.Ps, 81.16.-c http://dspace.nbuv.gov.ua/handle/123456789/117741 |
|
| Language |
en
|
|
| Relation |
Semiconductor Physics Quantum Electronics & Optoelectronics
|
|
| Publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
|
|