Determination of surface parameters of solids by methods of X-ray total external reflection
Vernadsky National Library of Ukraine
Переглянути архів Інформація| Поле | Співвідношення | |
| Title |
Determination of surface parameters of solids by methods of X-ray total external reflection
|
|
| Creator |
Balovsyak, S.V.
Fodchuk, I.M. Lytvyn, P.M. |
|
| Description |
The series of GaAs and SiO₂ samples with the specially prepared one- and two-dimensional surface reliefs have been investigated by the methods of integral and differential curve total external reflection of X-rays. The direct and inverse problem was solved, taking into consideration data obtained by the method of atomic-force microscopy: the theoretical curves of total external reflection are calculated and parameters describing a surface relief of the samples are restored.
|
|
| Date |
2017-05-27T16:46:49Z
2017-05-27T16:46:49Z 2003 |
|
| Type |
Article
|
|
| Identifier |
Determination of surface parameters of solids by methods of X-ray total external reflection / S.V. Balovsyak, I.M. Fodchuk, P.M. Lytvyn // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 1. — С. 41-46. — Бібліогр.: 9 назв. — англ.
1560-8034 PACS: 61.10.Kw, 61.43.Hv, 68.35.-p http://dspace.nbuv.gov.ua/handle/123456789/117940 |
|
| Language |
en
|
|
| Relation |
Semiconductor Physics Quantum Electronics & Optoelectronics
|
|
| Publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
|
|