Investigation of superlattice structure parameters using quasi-forbidden reflections
Vernadsky National Library of Ukraine
Переглянути архів Інформація| Поле | Співвідношення | |
| Title |
Investigation of superlattice structure parameters using quasi-forbidden reflections
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| Creator |
Kladko, V.P.
Datsenko, L.I. Korchovyi, A.A. Machulin, V.F. Lytvyn, P.M. Shalimov, A.V. Kuchuk, A.V. Kogutyuk, P.P. |
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| Description |
We studied possibilities of a nondestructive X-ray technique for testing short-period strained GaAs-AlAs superlattices. An analysis of the quasi-forbidden 200 reflections may be used for determination of superlattice layer structure parameters and sublayer thickness. The effect of irregularity of superlattice transition region on X-ray diffraction reflection curves and elastic strains in layers was studied.
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| Date |
2017-05-28T14:28:06Z
2017-05-28T14:28:06Z 2003 |
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| Type |
Article
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| Identifier |
Investigation of superlattice structure parameters using quasi-forbidden reflections / V.P. Kladko, L.I. Datsenko, A.A. Korchovyi, V.F. Machulin, P.M. Lytvyn, A.V. Shalimov, A.V. Kuchuk, P.P. Kogutyuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 3. — С. 392-396. — Бібліогр.: 7 назв. — англ.
1560-8034 PACS: 68.65.Cd http://dspace.nbuv.gov.ua/handle/123456789/118048 |
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| Language |
en
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| Relation |
Semiconductor Physics Quantum Electronics & Optoelectronics
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| Publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
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