Effect of nanosize metal overlayer on C₆₀ thin film optical parameters near fundamental absorption edge
Vernadsky National Library of Ukraine
Переглянути архів Інформація| Поле | Співвідношення | |
| Title |
Effect of nanosize metal overlayer on C₆₀ thin film optical parameters near fundamental absorption edge
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| Creator |
Dmitruk, N.L.
Borkovskaya, O.Yu. Naumenko, D.O. Havrylenko, T.S. Basiuk, E. Shpilevsky, E.M. |
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| Description |
The effect of nanosize metal overlayer, both evaporated on C₆₀ films (Bi, In) and attached as nanoparticles of (Ag, Au), on the optical parameters of C₆₀ films near the fundamental absorption edge has been studied. The values of direct band gap (Eg), the optical gap (E₀) in the framework of Tauc model and the Urbach tail parameter (EU) were determined from the absorption coefficient (α) spectra plotted in coordinates (αhν)², (αhν)¹/² ln(α) vs hν, respectively. Parameters obtained testify diminishing the structural disorder in C₆₀ thin films with nanosize metal overlayer at optimal ratio of C₆₀ to metal layer thicknesses.
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| Date |
2017-05-29T14:41:48Z
2017-05-29T14:41:48Z 2012 |
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| Type |
Article
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| Identifier |
Effect of nanosize metal overlayer on C₆₀ thin film optical parameters near fundamental absorption edge / N.L. Dmitruk, O.Yu. Borkovskaya, D.O. Naumenko, T.S. Havrylenko, E. Basiuk, E.M. Shpilevsky // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 1. — С. 61-64. — Бібліогр.: 8 назв. — англ.
1560-8034 PACS 78.40.Ri, 78.67.Bf http://dspace.nbuv.gov.ua/handle/123456789/118275 |
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| Language |
en
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| Relation |
Semiconductor Physics Quantum Electronics & Optoelectronics
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| Publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
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