Запис Детальніше

Electrical and light-emitting properties of silicon dioxide co-implanted by carbon and silicon ions

Vernadsky National Library of Ukraine

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Поле Співвідношення
 
Title Electrical and light-emitting properties of silicon dioxide co-implanted by carbon and silicon ions
 
Creator Nazarov, A.N.
Osiyuk, I.N.
Tiagulskyi, S.I.
Lysenko, V.S.
Tyagulskyy, I.P.
Torbin, V.N.
Omelchuk, V.V.
Nazarova, T.N.
Rebohle, L.
Skorupa, W.
 
Description In this paper we explore the electrophysical and electroluminescence (EL)
properties of thermally grown 350 nm thick SiO₂ layers co-implanted with Si⁺
and C⁺
ions. The implanting fluencies were chosen in such a way that the peak concentration of
excess Si and C of 5-10 at.% were achieved. Effect of hydrogen plasma treatment on
electroluminescent and durability of SiO₂ (Si,C) - Si-system is studied. Combined
measurements of charge trapping and EL intensity as a function of the injected charge
and current have been carried out with the aim of clarifying the mechanisms of
electroluminescence. EL was demonstrated to have defect-related nature. Cross sections
of both electron traps and hole traps were determined. EL quenching at a great levels of
injected charge is associated with strong negative charge capture, following capture of
positive charge leading to electrical breakdown of SiO₂ structures.
 
Date 2017-06-03T05:04:44Z
2017-06-03T05:04:44Z
2008
 
Type Article
 
Identifier Electrical and light-emitting properties of silicon dioxide co-implanted by carbon and silicon ions / A.N. Nazarov, I.N. Osiyuk , S.I. Tiagulskyi, V.S. Lysenko, I.P. Tyagulskyy , V.N. Torbin, V.V. Omelchuk, T.M. Nazarova, L.Rebohle, W.Skorupa // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2008. — Т. 11, № 4. — С. 319-323. — Бібліогр.: 27 назв. — англ.
1560-8034
PACS 68.35,78.55
http://dspace.nbuv.gov.ua/handle/123456789/119072
 
Language en
 
Relation Semiconductor Physics Quantum Electronics & Optoelectronics
 
Publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України