Запис Детальніше

Separate determination of thickness and optical parameters by surface plasmon resonance: accuracy consideration

Vernadsky National Library of Ukraine

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Поле Співвідношення
 
Title Separate determination of thickness and optical parameters by surface plasmon resonance: accuracy consideration
 
Creator Rengevych, O.V.
Shirshov, Yu.M.
Ushenin, Yu.V
Beketov, A.G.
 
Description Reliability and precision of characterization of surface layers by SPR method was evaluated with relation to the experimental conditions and the strategy of extracting the film parameters. Consideration is bound up with sensor applications of SPR phenomenon and focused at problems of separate extraction of optical constants and thickness of the layer and determination of the total quantity of material constituting the surface coverage.
Computational scheme for modeling the SPR resonance for multilayer assembly, based on the Abeles matrix formalism, is presented. It is demonstrated that improper choice of the angle range the measurements are taken over may result in ambiguity in determination of the real part of the refractive index n and the film thickness d. Nevertheless, the total quantity of material in the film can be estimated with reasonable accuracy even when correct separate extraction of n and d parameters is hampered by experimental errors and inadequacy of theoretical model of layered system.
 
Date 2017-06-04T11:51:32Z
2017-06-04T11:51:32Z
1999
 
Type Article
 
Identifier Separate determination of thickness and optical parameters by surface plasmon resonance: accuracy consideration / O.V. Rengevych, Yu.M. Shirshov, Yu.V. Ushenin, A.G. Beketov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 2. — С. 28-35. — Бібліогр.: 28 назв. — англ.
1560-8034
PACS 73.20.M, 78.66, 42.79.P, Q, 78.20.C
http://dspace.nbuv.gov.ua/handle/123456789/119109
 
Language en
 
Relation Semiconductor Physics Quantum Electronics & Optoelectronics
 
Publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України