Thickness dependences of optical constants for thin layers of some metals and semiconductors
Vernadsky National Library of Ukraine
Переглянути архів Інформація| Поле | Співвідношення | |
| Title |
Thickness dependences of optical constants for thin layers of some metals and semiconductors
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| Creator |
Kovalenko, S.A.
Lisitsa, M.P. |
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| Description |
The review comprises investigations devoted to determination of refractive index and absorption coefficient dependences on thickness for thin films of metals and atomic semiconductors. It has been shown that erroneous results were obtained in many papers and correct interpretation of the latter is absent. The reason that braked the solution of the problem of dimensional optical phenomena in thin layer physics was ascertained. |
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| Date |
2017-06-06T12:58:28Z
2017-06-06T12:58:28Z 2001 |
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| Type |
Article
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| Identifier |
Thickness dependences of optical constants for thin layers of some metals and semiconductors / S.A. Kovalenko, M.P. Lisitsa // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2001. — Т. 4, № 4. — С. 352-357. — Бібліогр.: 13 назв. — англ.
1560-8034 PACS: 78.66 http://dspace.nbuv.gov.ua/handle/123456789/119328 |
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| Language |
en
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| Relation |
Semiconductor Physics Quantum Electronics & Optoelectronics
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| Publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
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