Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇₋δ microbridges and bicrystal junctions
Vernadsky National Library of Ukraine
Переглянути архів Інформація| Поле | Співвідношення | |
| Title |
Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇₋δ microbridges and bicrystal junctions
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| Creator |
Ivanov, Z.G.
Fogel, N.Ya. Yuzephovich, O.I. Stepantsov, E.A. Tzalenchuk, A.Ya. |
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| Subject |
Свеpхпpоводимость, в том числе высокотемпеpатуpная
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| Description |
We report on depairing critical currents in submicron YBa₂Cu₃O₇₋δ microbridges. A small-angle bicrystal grain boundary junction is used as a tool to study the entrance of vortices induced by a transport current and their influence on the I–V curves. The interplay between the depairing and the vortex motion determines a crossover in the temperature dependence of the critical current. The high entrance field of vortices in very narrow superconducting channels creates the possibility of carrying a critical current close to the depairing limit determined by the S–S–S nature of the small-angle grain boundary junction. |
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| Date |
2017-06-07T04:35:30Z
2017-06-07T04:35:30Z 2004 |
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| Type |
Article
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| Identifier |
Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇δ microbridges and bicrystal junctions / Z.G. Ivanov, N.Ya. Fogel, O.I. Yuzephovich, E.A. Stepantsov A.Ya. Tzalenchuk // Физика низких температур. — 2004. — Т. 30, № 3. — С. 276-281. — Бібліогр.: 12 назв. — англ.
0132-6414 PACS: 74.60.Jg, 74.60.Ec, 74.72.Bk http://dspace.nbuv.gov.ua/handle/123456789/119474 |
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| Language |
en
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| Relation |
Физика низких температур
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| Publisher |
Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
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