XRD method for the determination of internal stresses in KDP crystals and their relationship to the anomalous biaxiality
Vernadsky National Library of Ukraine
Переглянути архів Інформація| Поле | Співвідношення | |
| Title |
XRD method for the determination of internal stresses in KDP crystals and their relationship to the anomalous biaxiality
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| Creator |
Puzikov, V.M.
Tkachenko, V.F. Tsurikov, V.A. |
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| Subject |
Devices and instruments
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| Description |
Designed precision method for determining residual stresses in crystals of the KDP on the relative displacement of the rocking curves (RC), caused by the presence of tensile stress, compression from the {110} or {101}, with the asymmetric geometry of the shooting at the reflection. The error in determining the relative displacement of RC in this case is ±1 arcsec. The experimentally determined bias for RD crystals KDP, grown by different methods on samples cut from the prismatic and pyramidal growth sectors of the crystal. The relation between the value of the anomalous biaxiality 2V and a total displacement of RC due to the presence of internal tensile stress, compression in the crystal KDP.
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| Date |
2017-06-07T11:54:16Z
2017-06-07T11:54:16Z 2015 |
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| Type |
Article
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| Identifier |
XRD method for the determination of internal stresses in KDP crystals and their relationship to the anomalous biaxiality / V.M. Puzikov, V.F. Tkachenko, V.A. Tsurikov // Functional Materials. — 2015. — Т. 22, № 3. — С. 402-407. — Бібліогр.: 17 назв. — англ.
1027-5495 DOI: http://dx.doi.org/10.15407/fm22.03.402 http://dspace.nbuv.gov.ua/handle/123456789/119559 |
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| Language |
en
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| Relation |
Functional Materials
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| Publisher |
НТК «Інститут монокристалів» НАН України
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