Josephson effect and Andreev reflection in Ba₁₋xNaxFe₂As₂ (x = 0.25 and 0.35) point contacts
Vernadsky National Library of Ukraine
Переглянути архів Інформація| Поле | Співвідношення | |
| Title |
Josephson effect and Andreev reflection in Ba₁₋xNaxFe₂As₂ (x = 0.25 and 0.35) point contacts
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| Creator |
Fisun, V.V.
Balkashin, O.P. Kvitnitskaya, O.E. Korovkin, I.A. Gamayunova, N.V. Aswartham, S. Wurmehl, S. Naidyuk, Yu.G |
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| Subject |
III Международный семинар по микроконтактной спектроскопии
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| Description |
I(V) characteristics and their first derivatives of ScS and ScN-type (S is superconductor, c is constriction, N is normal metal) point contacts (PCs) based on Ba₁₋xNaxFe₂As₂ (x = 0.25 and 0.35) were studied. ScS-type PCs with S = Nb,Ta, and Pb show Josephson-like resistively shunted I(V) curves with microwave induced Shapiro steps which satisfy relation 2eV = ω. The IcRN product (Ic is critical current, RN is normal state PC resistance) in these PCs is found to be up to 1.2 mV. All this data with the observed dependence of the Ic on the microwave power of ScS PCs with Pb counterelectrode indicates the presence of the singlet s-wave type pairing in Ba₁₋xNaxFe₂As₂. From the dV/dI(V) curves of ScN-type PCs demonstrating Andreev-reflection like features, the superconducting gap ∆ ratio 2∆/kBTc = 3.6 ± 1 for the compound with x = 0.35 was evaluated. Analysis of these dV/dI(V) at high biases V, that is well above ∆, testifies transition to the thermal regime in PCs with a voltage increase. |
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| Date |
2017-06-08T04:41:19Z
2017-06-08T04:41:19Z 2014 |
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| Type |
Article
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| Identifier |
Josephson effect and Andreev reflection in Ba₁₋xNaxFe₂As₂ (x = 0.25 and 0.35) point contacts / V.V. Fisun, O.P. Balkashin, O.E. Kvitnitskaya, I.A. Korovkin, N.V. Gamayunova, S. Aswartham, S. Wurmehl, Yu.G. Naidyuk // Физика низких температур. — 2014. — Т. 40, № 10. — С. 1175-1181. — Бібліогр.: 24 назв. — англ.
0132-6414 PACS 74.50.+r, 74.70.Dd, 74.45.+c http://dspace.nbuv.gov.ua/handle/123456789/119675 |
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| Language |
en
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| Relation |
Физика низких температур
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| Publisher |
Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
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