Perspectives of development of X-ray analysis for material composition
Vernadsky National Library of Ukraine
Переглянути архів Інформація| Поле | Співвідношення | |
| Title |
Perspectives of development of X-ray analysis for material composition
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| Creator |
Mikhailov, I.F.
Baturin, A.A. Mikhailov, A.I. Fomina, L.P. |
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| Subject |
Characterization and properties
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| Description |
Perspectives are considered for increasing the sensitivity of X-ray analysis and broadening the range of measurements toward chemical elements with small atomic numbers up to hydrogen at the expense of formation of the optimized selective spectrum from a preliminary beam for exciting fluorescence and observing scattering peaks and diffraction reflections. It has been shown that low-power preliminary sources (X-ray tube, 20 W) are able to provide the detection limit for trace impurities near 0.1 ppm, and for hydrogen in metals - up to 10 ppm. The data presented are hopeful for attaining X-ray analysis sensitivity at the level of ppb units due to application of powerful preliminary beams (synchrotron, undulators, wigglers, etc.).
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| Date |
2017-06-08T07:32:50Z
2017-06-08T07:32:50Z 2016 |
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| Type |
Article
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| Identifier |
Perspectives of development of X-ray analysis for material composition / I.F. Mikhailov, A.A. Baturin, A.I. Mikhailov, L.P. Fomina // Functional Materials. — 2016. — Т. 23, № 1. — С. 5-14. — Бібліогр.: 14 назв. — англ.
1027-5495 DOI: dx.doi.org/10.15407/fm23.01.005 http://dspace.nbuv.gov.ua/handle/123456789/119712 |
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| Language |
en
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| Relation |
Functional Materials
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| Publisher |
НТК «Інститут монокристалів» НАН України
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