Optical properties of thin metal films
Vernadsky National Library of Ukraine
Переглянути архів Інформація| Поле | Співвідношення | |
| Title |
Optical properties of thin metal films
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| Creator |
Kovalenko, S.A.
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| Description |
Optical constants of metallic thin films made from: Ag, Au, Hf, Ir, Mo, Nb, Os, Pd, Pt, Re, Rh, Ru, Ta, W, Zr were determined on the basis of measured index of refraction in region of wavelength λ = 241216 Å. Two types of relations were used for the calculation. Some of them were obtained, with taking into account that refractive index of absorbing medium can be presented in the form ñ = n ± iæ. Other were obtained from Maxwell boundary condition. Both approaches give rise to very close results for æ, however the dependences n = f(λ) for λ > 200 Å are essentially different. The reasons of such differences are discussed.
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| Date |
2017-06-10T08:12:12Z
2017-06-10T08:12:12Z 1999 |
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| Type |
Article
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| Identifier |
Optical properties of thin metal films / S.A. Kovalenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 3. — С. 13-20. — Бібліогр.: 25 назв. — англ.
1560-8034 PACS: 78.66; 78.20.C http://dspace.nbuv.gov.ua/handle/123456789/119882 |
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| Language |
en
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| Relation |
Semiconductor Physics Quantum Electronics & Optoelectronics
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| Publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
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