The methodology for X-ray diffraction investigation of icosahedral quasicrystals substructure
Vernadsky National Library of Ukraine
Переглянути архів Інформація| Поле | Співвідношення | |
| Title |
The methodology for X-ray diffraction investigation of icosahedral quasicrystals substructure
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| Creator |
Bazdyreva, S.V.
Fedchuk, N.V. Malykhin, S.V. Pugachov, A.T. Reshetnyak, M.V. Zubarev, E.N. |
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| Subject |
Characterization and properties
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| Description |
Method of quantitative estimates of the parameters of the icosahedral quasicrystals substructure, including specific phason defects, developed and successfully worked out using the experimental models of quasicrystalline Al₇₀Pd₂₁Re₉, Ti₄₁.₅Zr₄₁.₅Ni₁₇ and Al₆₄.₅Pd₂₁Mn₁₄.₅ with different preparation technology. The method is based on the analysis of the diffraction lines' width of complete X-ray diffraction pattern. The results are in a good agreement with the prehistory of the samples.
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| Date |
2017-06-10T10:51:31Z
2017-06-10T10:51:31Z 2013 |
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| Type |
Article
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| Identifier |
The methodology for X-ray diffraction investigation of icosahedral quasicrystals substructure / S.V. Bazdyreva, N.V. Fedchuk, S.V. Malykhin, A.T. Pugachov, M.V. Reshetnyak, E.N. Zubarev // Functional Materials. — 2013. — Т. 20, № 1. — С. 81-86. — Бібліогр.: 27 назв. — англ.
1027-5495 DOI: dx.doi.org/10.15407/fm20.01.081 http://dspace.nbuv.gov.ua/handle/123456789/119902 |
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| Language |
en
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| Relation |
Functional Materials
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| Publisher |
НТК «Інститут монокристалів» НАН України
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