High-stable standard samples of mass in the nano-gram range
Vernadsky National Library of Ukraine
Переглянути архів Інформація| Поле | Співвідношення | |
| Title |
High-stable standard samples of mass in the nano-gram range
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| Creator |
Mikhailov, I.F.
Baturin, A.A. Bugaev, Ye.A. Mikhailov, A.I. Borisova, S.S. |
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| Subject |
Devices and instruments
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| Description |
High-stable mass standards prepared as magnetron sputtered super-smooth metal layers deposited on single crystal substrates were attested. The thin film standards were found to meet the requirements to government standards: they are homogeneous, long-lived, and can be attested by several independent methods. Using the standards, the measurement accuracy is provided not worse than 1 ng in the range from 1 to 17 ng, and not worse than 8 ng in the range from 17 to 3800 ng.
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| Date |
2017-06-11T05:46:35Z
2017-06-11T05:46:35Z 2013 |
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| Type |
Article
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| Identifier |
High-stable standard samples of mass in the nano-gram range / I.F. Mikhailov, A.A. Baturin, Ye.A. Bugaev, A.I. Mikhailov, S.S. Borisova // Functional Materials. — 2013. — Т. 20, № 2. — С. 266-271. — Бібліогр.: 9 назв. — англ.
1027-5495 DOI: dx.doi.org/10.15407/fm20.02.266 http://dspace.nbuv.gov.ua/handle/123456789/120075 |
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| Language |
en
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| Relation |
Functional Materials
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| Publisher |
НТК «Інститут монокристалів» НАН України
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