Laser scanning microscopy of HTS films and devices (Review Article)
Vernadsky National Library of Ukraine
Переглянути архів Інформація| Поле | Співвідношення | |
| Title |
Laser scanning microscopy of HTS films and devices (Review Article)
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| Creator |
Zhuravel, A.P.
Sivakov, A.G. Turutanov, O.G. Omelyanchouk, A.N. Anlage, S.M. Lukashenko, A. Ustinov, A.V. Abraimov, D. |
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| Subject |
Experimental Methods and Applications
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| Description |
The work describes the capabilities of laser scanning microscopy (LSM) as a spatially-resolved method of testing high–Tc materials and devices. The earlier results obtained by the authors are briefly reviewed. Some novel applications of the LSM are illustrated, including imaging the HTS responses in rf mode, probing the superconducting properties of HTS single crystals, development of two-beam laser scanning microscopy. The existence of the phase slip lines mechanism of resistivity in HTS materials is proven by LSM imaging. |
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| Date |
2017-06-11T12:44:24Z
2017-06-11T12:44:24Z 2006 |
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| Type |
Article
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| Identifier |
Laser scanning microscopy of HTS films and devices
(Review Article) / A.P. Zhuravel, A.G. Sivakov, O.G. Turutanov, A.N. Omelyanchouk, S.M. Anlage, A. Lukashenko, A.V. Ustinov, D. Abraimov // Физика низких температур. — 2006. — Т. 32, № 6. — С. 775–794. — Бібліогр.: 74 назв. — англ.
0132-6414 PACS: 68.37.–d, 74.25.Nf, 74.78.Bz, 85.25.–j http://dspace.nbuv.gov.ua/handle/123456789/120206 |
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| Language |
en
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| Relation |
Физика низких температур
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| Publisher |
Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
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