Residual error after non-uniformity correction
Vernadsky National Library of Ukraine
Переглянути архів Інформація| Поле | Співвідношення | |
| Title |
Residual error after non-uniformity correction
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| Creator |
Borovytsky, V.N.
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| Description |
The paper represents the technique for residual error evaluation after two-points linear non-uniformity correction. This technique takes into consideration parameters of an imaging system, reference sources, non-linearity and noise of a focal plane array.
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| Date |
2017-06-11T13:14:06Z
2017-06-11T13:14:06Z 2000 |
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| Type |
Article
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| Identifier |
Residual error after non-uniformity correction / V.N. Borovytsky // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2000. — Т. 3, № 1. — С. 102-105. — Бібліогр.: 4 назв. — англ.
1560-8034 PACS 07.07.D,42.79.P,Q http://dspace.nbuv.gov.ua/handle/123456789/120229 |
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| Language |
en
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| Relation |
Semiconductor Physics Quantum Electronics & Optoelectronics
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| Publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
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