The structure, phase and chemical composition of CZTSe thin films
Vernadsky National Library of Ukraine
Переглянути архів Інформація| Поле | Співвідношення | |
| Title |
The structure, phase and chemical composition of CZTSe thin films
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| Creator |
Opanasyuk, A.S.
Koval, P.V. Nam, D. Cheong, H. Jeong, A.R. Jo, W. Ponomarev, A.G. |
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| Subject |
Characterization and properties
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| Description |
Cu₂ZnSnSe₄ thin films obtained by co-evaporation of components using an electron beam evaporation system were investigated by scanning electron microscopy, X-ray analysis, PIXI and RBS methods. The analysis of the diffraction patterns showed that the films are almost single-phased and contain mainly CZTSe compound, which has a tetragonal kesterite lattice type. The samples have textural growth of [211]. The lattice parameters of the material varied in the range of a = (0.56640-0.56867) nm, c = (1.13466-1.13776) nm, c/2a = 0.9983-1.0017 which correlate well with the reference data in a stable phase CZTSe compounds. From our PIXE analyses we assessed the influence of the growth conditions on the samples chemical composition and mapped the surface distribution.
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| Date |
2017-06-12T07:29:26Z
2017-06-12T07:29:26Z 2014 |
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| Type |
Article
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| Identifier |
The structure, phase and chemical composition of CZTSe thin films / A.S. Opanasyuk, P.V. Koval, D. Nam, H. Cheong, A.R. Jeong, W. Jo, A.G. Ponomarev // Functional Materials. — 2014. — Т. 21, № 2. — С. 164-170. — Бібліогр.: 26 назв. — англ.
1027-5495 DOI: dx.doi.org/10.15407/fm21.02.164 http://dspace.nbuv.gov.ua/handle/123456789/120411 |
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| Language |
en
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| Relation |
Functional Materials
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| Publisher |
НТК «Інститут монокристалів» НАН України
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