Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method
Vernadsky National Library of Ukraine
Переглянути архів Інформація| Поле | Співвідношення | |
| Title |
Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method
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| Creator |
Tkachenko, V.F.
Kryvonogov, S.I. Budnikov, A.T. Lukienko, O.A. Vovk, E.A. |
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| Subject |
Characterization and properties
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| Description |
The methods of three-crystal X-ray diffractometry were used for investigating structure perfection in surface-adjacent damaged layer (DL) formed in the process of mechanical and chemical-mechanical treatment of sapphire crystals with the surface orientation {0001} {11-20}. Analysis of the diffraction reflection curves made it possible to establish the structure and character of distortions in the DL. There was established the mean-square disorientation between the fragments, which allowed to characterize the defects structure of the surface-adjacent DL.
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| Date |
2017-06-12T07:30:07Z
2017-06-12T07:30:07Z 2014 |
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| Type |
Article
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| Identifier |
Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method / V.F. Tkachenko, S.I. Kryvonogov, A.T. Budnikov, O.A. Lukienko, E.A. Vovk // Functional Materials. — 2014. — Т. 21, № 2. — С. 171-175. — Бібліогр.: 17 назв. — англ.
1027-5495 DOI: dx.doi.org/10.15407/fm21.02.171 http://dspace.nbuv.gov.ua/handle/123456789/120413 |
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| Language |
en
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| Relation |
Functional Materials
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| Publisher |
НТК «Інститут монокристалів» НАН України
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