Impurity induced Dirac point smearing in graphene
Vernadsky National Library of Ukraine
Переглянути архів Інформація| Поле | Співвідношення | |
| Title |
Impurity induced Dirac point smearing in graphene
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| Creator |
Skrypnyk, Yu.V.
Loktev, V.M. |
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| Subject |
International Conference "Statistical Physics 2006. Condensed Matter: Theory and Application"
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| Description |
It is shown that in a two-dimensional system with the linear dispersion a resonance is present in the Dirac point vicinity, when the impurity perturbation magnitude exceeds the bandwidth. The corresponding spectrum rearrangement, which follows at a certain critical impurity concentration, results in the square root dependence of the concentration smearing region width on the concentration. If the perturbation magnitude does not exceed the bandwidth, or the critical concentration is not reached, the concentration smearing region width remains exponentially small. |
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| Date |
2017-06-13T10:39:23Z
2017-06-13T10:39:23Z 2007 |
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| Type |
Article
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| Identifier |
Impurity induced Dirac point smearing in graphene / Yu.V. Skrypnyk, V.M. Loktev // Физика низких температур. — 2007. — Т. 33, № 9. — С. 1002–1007. — Бібліогр.: 19 назв. — англ.
0132-6414 PACS: 71.23.An, 71.30.+h http://dspace.nbuv.gov.ua/handle/123456789/120932 |
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| Language |
en
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| Relation |
Физика низких температур
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| Publisher |
Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
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