Simulation of low angle X-ray diffraction on multilayers subjected to diffusion
Vernadsky National Library of Ukraine
Переглянути архів Інформація| Поле | Співвідношення | |
| Title |
Simulation of low angle X-ray diffraction on multilayers subjected to diffusion
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| Creator |
Fedorov, A.G.
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| Description |
Calculative method based on the Riccatti type differential equation was tested for simulation of low angle X-ray diffraction patterns from the one-dimensionally ordered multilayer. Some peculiarities of diffraction were revealed connected with asymmetrical distortion of the multilayer profile due to different processes on the layer boundaries.
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| Date |
2017-06-13T16:46:28Z
2017-06-13T16:46:28Z 2000 |
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| Type |
Article
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| Identifier |
Simulation of low angle X-ray diffraction on multilayers subjected to diffusion / A.G. Fedorov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2000. — Т. 3, № 4. — С. 554-557. — Бібліогр.: 6 назв. — англ.
1560-8034 PACS: 61.10.N, 68.65 http://dspace.nbuv.gov.ua/handle/123456789/121196 |
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| Language |
en
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| Relation |
Semiconductor Physics Quantum Electronics & Optoelectronics
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| Publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
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