Запис Детальніше

Hysteretic phenomena in Xe-doped C₆₀ from x-ray diffraction

Vernadsky National Library of Ukraine

Переглянути архів Інформація
 
 
Поле Співвідношення
 
Title Hysteretic phenomena in Xe-doped C₆₀ from x-ray diffraction
 
Creator Prokhvatilov, A.I.
Galtsov, N.N.
Legchenkova, I.V.
Strzhemechny, M.A.
Cassidy, D.
Gadd, G.E.
Moricca, S.
Sundqvist, B.
Aksenova, N.A.
 
Subject Динамика кристаллической решетки
 
Description Polycrystalline fullerite С₆₀ intercalated with Xe atoms at 575 K and a pressure of 200 MPa was studied by powder x-ray diffraction. The integrated intensities of a few brighter reflections have been utilized to evaluate the occupancy of the octahedral interstitial sites in С₆₀ crystals, which turned out to be (34±4) %, and in good agreement with another independent estimate. It is found that reflections of the (h00) type become observable in Xe-doped С₆₀. The presence of xenon in the octahedral sites affects both the orientational phase transition as well as the glassification process, decreasing both characteristic temperatures as well as smearing the phase transition over a greater temperature range. Considerable hysteretic phenomena have been observed close to the phase transition and the glassification temperature. The signs of the two hysteresis loops are opposite. There is reliable evidence that at lowest temperatures studied the thermal expansion of the doped crystal is negative under cool-down.
 
Date 2017-06-14T11:52:59Z
2017-06-14T11:52:59Z
2005
 
Type Article
 
Identifier Hysteretic phenomena in Xe-doped C₆₀ from x-ray diffraction / A.I. Prokhvatilov, N.N. Galtsov, I.V. Legchenkova, M. A. Strzhemechny, D. Cassidy, G.E. Gadd, S. Moricca, B. Sundqvist, N.A. Aksenova // Физика низких температур. — 2005. — Т. 31, № 5. — С. 585-589. — Бібліогр.: 27 назв. — англ.
0132-6414
PACS: 61.10.Nz, 81.05.Tp, 64.70.–p
http://dspace.nbuv.gov.ua/handle/123456789/121465
 
Language en
 
Relation Физика низких температур
 
Publisher Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України