Degradation processes in LED modules
Vernadsky National Library of Ukraine
Переглянути архів Інформація| Поле | Співвідношення | |
| Title |
Degradation processes in LED modules
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| Creator |
Sorokin, V.M.
Kudryk, Ya.Ya. Shynkarenko, V.V. Kudryk, R.Ya. Sai, P.O. |
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| Description |
Electrical-heat-light degradation model of a light-emitting module has been developed in this work. The Monte-Carlo method was used to calculate the reliability time of LED modules with different halfwidth of LED chip series resistance. Separation of LED chips with different series resistance before assembling may increase the time of emission in a stable mode up to 10%.
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| Date |
2017-06-14T17:19:46Z
2017-06-14T17:19:46Z 2016 |
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| Type |
Article
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| Identifier |
Degradation processes in LED modules / V.M. Sorokin, Ya.Ya. Kudryk, V.V. Shynkarenko, R.Ya. Kudryk, P.O. Sai // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2016. — Т. 19, № 3. — С. 248-254. — Бібліогр.: 5 назв. — англ.
1560-8034 DOI: 10.15407/spqeo19.03.248 PACS 44.05.+e, 02.70.Rr, 42.72.-g http://dspace.nbuv.gov.ua/handle/123456789/121585 |
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| Language |
en
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| Relation |
Semiconductor Physics Quantum Electronics & Optoelectronics
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| Publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
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