Evolutionary distributed test generation methods for digital circuits
Електронний архів E-archive DonNTU – (Electronic archive Donetsk National Technical University)
Переглянути архів Інформація| Поле | Співвідношення | |
| Title |
Evolutionary distributed test generation methods for digital circuits
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| Creator |
Ivanov, Dmitry
Skobtsov, Vadim Skobtsov, Yurij |
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| Subject |
evolutionary computations
genetic algorithm sequential circuits test generation parallel algorithm islands model |
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| Description |
The genetic algorithms of test generation and fault simulation for digital circuits are considered. The main modes of genetic algorithm parallelization for test generation and simulation are represented - “worker-farmer”, “island model”. The program implementation and computer experiments of proposed methods are discussed.
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| Date |
2011-10-12T06:51:49Z
2011-10-12T06:51:49Z 2008 |
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| Type |
Article
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| Identifier |
Y.A. Skobtsov, D.E. Ivanov, V.Y. Skobtsov Evolutionary distributed test generation methods for digital circuits // Proc. of 8th International Workshop on Boolean Problems, September 18-19, 2008, Freiberg, Germany.- pp.213-218.
http://ea.donntu.edu.ua/handle/123456789/1445 |
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| Language |
en
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| Publisher |
Proc. of 8th International Workshop on Boolean Problems, September 18-19, 2008, Freiberg, Germany
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