Distributed Genetic Algorithm of Test Generation For Digital Circuits
Електронний архів E-archive DonNTU – (Electronic archive Donetsk National Technical University)
Переглянути архів Інформація| Поле | Співвідношення | |
| Title |
Distributed Genetic Algorithm of Test Generation For Digital Circuits
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| Creator |
Ivanov, Dmitry
Skobtsov, Yurij El-Khatib |
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| Subject |
genenic algorithms
distributed calculations test generation fault simulation digital circuits |
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| Description |
The distributed genetic algorithms are considered for problem of test generation. The different forms of parallelization of genetic algorithms are investigated for test generation.
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| Date |
2011-10-12T07:04:55Z
2011-10-12T07:04:55Z 2006 |
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| Type |
Article
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| Identifier |
Skobtsov Y.A., El-Khatib, Ivanov D.E. Distributed Genetic Algorithm of Test Generation For Digital Circuits // Proceedings of the 10th Biennial Baltic Electronics Conference.-Tallinn Technical University,2006.-p.281-284.
http://ea.donntu.edu.ua/handle/123456789/1449 |
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| Language |
en
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| Publisher |
Proceedings of the 10th Biennial Baltic Electronics Conference.
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