Evolutionary approach to the functional test generation for digital circuits
Електронний архів E-archive DonNTU – (Electronic archive Donetsk National Technical University)
Переглянути архів Інформація| Поле | Співвідношення | |
| Title |
Evolutionary approach to the functional test generation for digital circuits
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| Creator |
Ivanov, Dmitry
Skobtsov, Yurij Skobtsov, Vadim Ubar, Raimond |
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| Subject |
digital circuit
genetic algorithm sequential circuits BIST test generation functional approach |
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| Description |
In the paper an evolutionary approach for functional testing of digital circuits is considered. A genetic algorithm for testing digital multiplier is proposed. The main target of the proposed method is to generate as short as possible functional test wih as high as possible fault coverage with the goal to use the generated patterns as the input data for embedded functional BIST. Experimental data of the program realization is also represented.
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| Date |
2011-10-12T07:28:58Z
2011-10-12T07:28:58Z 2004 |
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| Type |
Article
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| Identifier |
Y. A. Skobtsov, D. E. Ivanov, V. Y. Skobtsov, R. Ubar. Evolutionary approach to the functional test generation for digital circuits. In Proc. of 9th Biennial Baltic Electronics Conf., BEC 2004 (Tallinn, Oct. 2004), pp. 229-232. Tallinn Univ. of Techn., 2004.
http://ea.donntu.edu.ua/handle/123456789/1453 |
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| Language |
en
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| Publisher |
Proc. of 9th Biennial Baltic Electronics Conf., BEC 2004
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