Запис Детальніше

THE DISTINGUISHING FUNCTIONS IN TEST GENERATION OF DIGITAL SEQUENTIAL CIRCUITS WITH MULTIPLE OBSERVATION TIME STRATEGY

Електронний архів E-archive DonNTU – (Electronic archive Donetsk National Technical University)

Переглянути архів Інформація
 
 
Поле Співвідношення
 
Title THE DISTINGUISHING FUNCTIONS IN TEST GENERATION OF DIGITAL SEQUENTIAL CIRCUITS WITH MULTIPLE OBSERVATION TIME STRATEGY
 
Creator Скобцов, Юрий Александрович
Скобцов, Вадим Юрьевич
 
Subject sequential circuits
test generation
distinguishing function
multiple observation time strategy
 
Description An analytical approach is considered to test generation for circuits with memory which is based on method of the distinguishing functions. It uses the symbolic simulation and multiple observation time strategy of output signals, which can improve the fault coverage of test. We consider two forms of distinguishing function – disjunctive and conjunctive. Disjunctive form identifies distinguishable state pairs of good and faulty circuits and reduces the problem of test generation to verifying tautologies of distinguishing function. Conjunctive form determines the pairs of indistinguishable states and reduces the problem of test generation to satisfiability of Boolean functions problem (SAT).
An analytical approach is considered to test generation for circuits with memory which is based on method of the distinguishing functions. It uses the symbolic simulation and multiple observation time strategy of output signals, which can improve the fault coverage of test. We consider two forms of distinguishing function – disjunctive and conjunctive. Disjunctive form identifies distinguishable state pairs of good and faulty circuits and reduces the problem of test generation to verifying tautologies of distinguishing function. Conjunctive form determines the pairs of indistinguishable states and reduces the problem of test generation to satisfiability of Boolean functions problem (SAT).
 
Date 2012-03-20T16:55:26Z
2012-03-20T16:55:26Z
2011-05
 
Type Article
 
Identifier Yuriy Skobtsov, Vadim Skobtsov.THE DISTINGUISHING FUNCTIONS IN TEST GENERATION OF DIGITAL SEQUENTIAL CIRCUITS WITH MULTIPLE OBSERVATION TIME STRATEGY//Proceedings of 1-st International Workshop "Critical infrastructur safety and security"(CrISS-DESERT'2011).-Vol.2.-P.441-450
978-966-662-227-6
http://ea.donntu.edu.ua/handle/123456789/9448
 
Language en
 
Publisher ХАИ