Запис Детальніше

Surface plasmon-polariton resonance at diffraction of THz radiation on semiconductor gratings

Vernadsky National Library of Ukraine

Переглянути архів Інформація
 
 
Поле Співвідношення
 
Title Surface plasmon-polariton resonance at diffraction of THz radiation on semiconductor gratings
 
Creator Spevak, I.S.
Kuzmenko, A.A.
Tymchenko, M.
Gavrikov, V.K.
Shulga, V.M.
Feng, J.
Sun, H.B.
Kamenev, Yu.E.
Kats, A.V.
 
Subject К 75-летию открытия теплового сопротивления Капицы
 
Description Resonance diffraction of THz hidrogen cyanide laser radiation on a semiconductor (InSb) grating is studied both
experimentally and theoretically. The specular reflectivity suppression due to the resonance excitation of the THz
surface plasmon-polariton is observed on a pure semiconductor grating and on semiconductor gratings covered with
a thin dielectric layer. The dielectric coating of the grating results in the resonance shift and widening depending
both on the layer thickness and dielectric properties. A simple analytical theory of the resonance diffraction on rather
shallow gratings covered with a dielectric layer is presented, and the results are in a good accordance with the
experimental data. Analytical expressions for the resonance shift and broadening are essential for the resonance
properties understanding and useful for sensing data interpretation of the agents deposited on the grating surface.
 
Date 2018-01-18T17:06:02Z
2018-01-18T17:06:02Z
2016
 
Type Article
 
Identifier Surface plasmon-polariton resonance at diffraction of THz radiation on semiconductor gratings / I.S. Spevak, A.A. Kuzmenko, M. Tymchenko, V.K. Gavrikov, V.M. Shulga, J. Feng, H.B. Sun, Yu.E. Kamenev, A.V. Kats // Физика низких температур. — 2016. — Т. 42, № 8. — С. 887-891. — Бібліогр.: 29 назв. — англ.
0132-6414
PACS: 42.25.Fx
http://dspace.nbuv.gov.ua/handle/123456789/129275
 
Language en
 
Relation Физика низких температур
 
Publisher Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України