Increasing the sensitivity of X-ray fluorescent scheme with secondary radiator using the initial spectrum filtration
Vernadsky National Library of Ukraine
Переглянути архів Інформація| Поле | Співвідношення | |
| Title |
Increasing the sensitivity of X-ray fluorescent scheme with secondary radiator using the initial spectrum filtration
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| Creator |
Mikhailov, I.F.
Baturin, A.A. Mikhailov, A.I. Borisova, S.S. |
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| Subject |
Devices and instruments
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| Description |
Optimization of the primary filter in the scheme with fluorescent re-radiator was carried out using the minimum detection limit criterion Cmin. It was established experimentally, that the filtration provides three-fourfold increase for the contrast and 70 % gain for the detection limit. For All trace impurities in ion-exchange resins, the achieved sensitivity about 1 ppm does not yield to values obtained in the complex Barkla scheme using polarized radiation.
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| Date |
2018-06-14T18:03:16Z
2018-06-14T18:03:16Z 2012 |
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| Type |
Article
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| Identifier |
Increasing the sensitivity of X-ray fluorescent scheme with secondary radiator using the initial spectrum filtration / I.F. Mikhailov, A.A. Baturin, A.I. Mikhailov, S.S. Borisova // Functional Materials. — 2012. — Т. 19, № 1. — С. 126-129. — Бібліогр.: 6 назв. — англ.
1027-5495 http://dspace.nbuv.gov.ua/handle/123456789/135279 |
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| Language |
en
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| Relation |
Functional Materials
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| Publisher |
НТК «Інститут монокристалів» НАН України
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