Silicon crystal strength reduction due to magnetoresonance
Vernadsky National Library of Ukraine
Переглянути архів Інформація| Поле | Співвідношення | |
| Title |
Silicon crystal strength reduction due to magnetoresonance
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| Creator |
Makara, V.A.
Pogorilyi, A.M. Steblenko, L.P. Kuryliuk, A.M. Naumenko, S.M. Kobzar, Yu.L. Kravets, A.F. Podyalovsky, D.I. Matveeva, O.V. |
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| Description |
The magnetoresonance influence as well as the micrawave superhigh-frequency (SHF) magnetic field effect on the microhardness of silicon crystals has been studied. It is established that the action of SHF field results in decreasing microhardness, which does not relax for initial value during a long time (50 days). A mechanism has been suggested for the revealed effects.
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| Date |
2018-06-16T13:06:25Z
2018-06-16T13:06:25Z 2007 |
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| Type |
Article
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| Identifier |
Silicon crystal strength reduction due to magnetoresonance / V.A. Makara, A.M. Pogorilyi, L.P. Steblenko, A.M. Kuryliuk, S.M. Naumenko, Yu.L. Kobzar, A.F. Kravets, D.I. Podyalovsky, O.V. Matveeva // Functional Materials. — 2007. — Т. 14, № 2. — С. 192-194. — Бібліогр.: 8 назв. — англ.
1027-5495 http://dspace.nbuv.gov.ua/handle/123456789/136494 |
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| Language |
en
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| Relation |
Functional Materials
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| Publisher |
НТК «Інститут монокристалів» НАН України
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