Method of evaluating the level of confidence based on metrological risks for determining the coverage factor in the concept of uncertainty
Репозитарій Вінницького Національного Технічного Університету
Переглянути архів Інформація| Поле | Співвідношення | |
| Title |
Method of evaluating the level of confidence based on metrological risks for determining the coverage factor in the concept of uncertainty
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| Creator |
Vasilevskyi, Oleksandr
Didych, Volodymyr Kravchenko, Anna Yakovlev, Maksym Andrikevych, Iryna Kompanets, Dmytro Danylyuk, Yevhen Wójcik, Waldemar Nurmakhambetov, Askhat Васілевський, О. М. Компанець, Д. |
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| Subject |
measurements
uncertainty level of confidence metrological risks activity of ions expanded uncertainty |
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| Description |
A method for estimating the level of confidence for determining the coverage factor based on metrological risks is proposed using the example of using information on tolerances and uncertainty of measuring the activity of ions, which allows to establish a reasonable interval around the measurement result, within which most of the values that can be justified are assigned to the measured value.
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| Date |
2018-11-23T12:43:45Z
2018-11-23T12:43:45Z 2018 |
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| Type |
Article
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| Identifier |
Method of evaluating the level of confidence based on metrological risks for determining the coverage factor in the concept of uncertainty [Electronic resource] / Oleksandr Vasilevskyi, Volodymyr Didych, Anna Kravchenko [etc.] // Proceedings of SPIE. Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2018, Wilga, Poland, 3-10 June 2018. – 2018. – Vol. 10808, 108082C. – P. 108082C-1–108082C-6. – DOI: https://doi.org/10.1117/12.2501576.
978-151-062-203-6 0277-786X http://ir.lib.vntu.edu.ua//handle/123456789/22915 10.1117/12.2501576 |
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| Language |
uk_UA
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| Relation |
Proceedings of SPIE. Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2018, Wilga, Poland, 3-10 June 2018. Vol. 10808.
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| Format |
application/pdf
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| Publisher |
SPIE
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