The Essentials of Testing Digital Circuits
Електронного архіву Харківського національного університету радіоелектроніки (Open Access Repository of KHNURE)
Переглянути архів Інформація| Поле | Співвідношення | |
| Title |
The Essentials of Testing Digital Circuits
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| Creator |
Ngene, C. U.
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| Subject |
design for testability
reliability faults defect level |
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| Description |
Testing is an important part of digital devices development life cycle and it takes about 70% of time to market. This paper discusses the various testing concepts as it relates to digital design and how it impacts the reliability of the final product. We also show that making designs testable by using appropriate design for testability techniques considerably reduces testing time and ensures a fine-grained diagnosis of finished product. A three bit counter circuit was used to illustrate the benefits of design for testability by using scan chain methodology.
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| Date |
2016-08-17T07:31:19Z
2016-08-17T07:31:19Z 2012 |
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| Type |
Article
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| Identifier |
Ngene, C. U. The Essentials of Testing Digital Circuits / C. U. Ngene // Радиоэлектроника и информатика : науч.-техн. журн. – Х. : Изд-во ХНУРЭ, 2012. – Вып. 1. – С. 22-30.
http://openarchive.nure.ua/handle/document/1818 |
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| Language |
en
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| Publisher |
ХНУРЭ
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