Assertion Based Method of Functional Defects for Diagnosing and Testing Multimedia Devices
Електронного архіву Харківського національного університету радіоелектроніки (Open Access Repository of KHNURE)
Переглянути архів Інформація| Поле | Співвідношення | |
| Title |
Assertion Based Method of Functional Defects for Diagnosing and Testing Multimedia Devices
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| Creator |
Hahanov, V.
Mostova, K. Paschenko, O. |
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| Subject |
Assertion Based Method
Functional Defects for Diagnosing Testing Multimedia Devices |
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| Description |
Essential increase of consumer requirements for complex electronic devices leads to substantial growth of complexity for HW and SW components, services, and system interfaces. Such tendency increases the importance to provide high quality for HW, SW, and networking components and services. Well known rule of ten for hardware components stating that fault detection cost increases in ten times on the next following design or manufacturing stages. The same rule is effectively applicable for Software design stages.One of the main goals which comes to the foreground of industry is to decrease the cost of exploitation by creating the standardized infrastructures for maintenance which providing service exploitation, testing, disposal and, elimination of functional defects. Nowadays fast growing complexities of hardware is transforming this rule into rule of twenty which makes even more important to detect the fault on early design stages, rather then on chip/PCB manufacturing, or system assembling stages [1]. Goal of this work is to develop method which increases product quality by means of developing sufficient HW/SW test and diagnosis approach, also decreasing faults detection and defects localization time in order to improve system performance on example of multimedia devices.
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| Date |
2016-09-01T12:14:20Z
2016-09-01T12:14:20Z 2012 |
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| Type |
Article
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| Identifier |
Vladimir Hahanov Assertion Based Method of Functional Defects for Diagnosing and Testing Multimedia Devices /Vladimir Hahanov Karyna Mostova Oleksandr Paschenko //Proceedings of IEEE East-West Design & Test Symposium (EWDTS’2012)
http://openarchive.nure.ua/handle/document/1922 |
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| Language |
en
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| Publisher |
EWDTS
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